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 SINGLE CRYSTAL CHARACTERIZATION BY X‐RAY DIFFRACTION SERVICE REQUEST FORM Dr. Duane Choquesillo Lazarte Factoría de Cristalización Avenida de Las Palmeras, nº4 18100 Armilla ‐ Granada (Spain) Phone: +34 958230000; Ext. 190009 Fax: +34 958552620 lafactoria@lec.csic.es http://lafactoria.lec.csic.es
USER INFORMATION NAME: TITLE: E‐MAIL: TEL.: DATE (DD/MM/YYYY): FAX: DEPARTMENT: INTERNAL ID NUMBER: COMPANY/INSTITUTION: (To be filled by La Factoría de Cristalización) SAMPLE INFORMATION SAMPLE ID: PROPOSED EMPIRICAL FORMULA: SOLVENT(S) USED DURING PREPARATION/CRYSTALLIZATION:
ARE THE CRYSTALS AIR‐SENSITIVE: HYGROSCOPIC: LIGHT SENSITIVE: DATA COLLECTION: (TEMPERATURE: ABSOLUTE STRUCTURE DETERMINATION?: ) DRAWING OF PROPOSED STRUCTURE AND/OR PRECURSORS (include all reagents and solvents used) ONLY COLLECT IF CELL IS NOT (GIVE CELL BELOW)
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b  c  SAFETY INFORMATION WITHOUT RISKS: CARCINOGENIC: BIOLOGICAL HAZARD: FLAMMABLE: CORROSIVE: OTHER: OXIDASING: EXPLOSIVE: TOXIC: ACIDIC: SINGLE CRYSTAL CHARACTERIZATION BY X‐RAY DIFFRACTION SERVICE UNIT CELL DETERMINATION (INCLUDES SAMPLE PREPARATION) DATA COLLECTION ONLY CRYSTAL STRUCTURE DETERMINATION STRUCTURE ANALYSIS CHOOSE Equipment: Bruker X8 Proteum diffractometer with a Cu rotating anode generator, Montel optics and a Smart 6000 CCD detector.